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  Global Journal of Physical Chemistry. Volume 2, Issue 2 (2011) pp. 104-109
  Research Article Free Article
Structural and optical properties of Cd1-xZnxTe thin films grown by RF-sputtering
  Y. El gabbasa, H. Bellakhdera, M. A. El idrissi Raghnib, A. Outzourhita, A. Abouelaoualima  
a Solid state physics and thin films Laboratory (LPSCM)
b Materials Sciences Laboratory (LSM) Faculty of sciences Semlalia ( F.S.S.M), Cadi Ayyad University (UCAM) P.O.Box 2390, Marrakech, Morocco

  Cd1-xZnxTe alloy thin films with 1.68, 1.75 and 1.80 eV band gap were grown by cathodic radio frequency sputtering from CdTe and ZnTe targets on glass substrates. The films were characterized using X-ray diffraction (XRD), scanning electron microscopy, and optical transmittance measurements. It was found that the observed XRD reflections of all the samples index to the cubic phase of the Cd1-xZnxTe with (111) preferred orientation. The lattice parameter was found to be 6.426, 6.413 and 6.331 nm, respectively for films with composition of 0.16, 0.2 and 0.4.
  Thin films; CdZnTe; CdTe; ZnTe; RF Sputtering  

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