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  Journal of Nanoscience Letters 2013, 3: 16
  Research Article
Effect of laser frequency on pulsed laser grown polycrystalline 0.85Pb(Mg1/3Nb2/3)O3-0.15PbTiO3 thin films
  D. Saranya, Jayanta Parui, S. B. Krupanidhi  
Materials Research Centre, Indian Institute of Science, Bangalore – 560012, India
  Pulsed laser deposition technique was used to deposit 0.85Pb(Mg1/3Nb2/3)O3-0.15PbTiO3 ferroelectric thin films onto LSCO/ (111) Pt/TiO2/SiO2/Si substrate at different repetition rates. The influence of repetition rate on the phase formation, microstructure, stoichiometry and the electrical properties of the thin films are investigated. X-ray diffraction was used to study the crystalline phase formation of the deposited films. The microstructures of the films were characterized using contact mode Atomic Force Microscope (AFM) and scanning electron microscope (SEM). The surface roughness and the films morphology were noticed to change on laser frequency variations. The room temperature P-E hysteresis was studied in metal–ferroelectric –metal configuration and it was observed that their properties are determined by laser frequency dependent surface roughness and grain size variation. From the experimental results obtained, it can be predicted that at low repetition rate the growth mode follows 3-D nucleation type which changes to 2-D nucleation type at higher repetition rate.
  Relaxor ferroelectrics; PMN-PT; Thin films; PLD; AFM; Nucleation  

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